The “Special Report—Test Applications” in our January issue focuses on the software tools as well as logic analyzers, protocol analyzers, BERTs, phase-noise testers, spectrum analyzers, vector network ...

The transition to HDMI 2.0 was overwhelmingly driven by the urge to support higher resolution signals, notably 4K HDR 4:4:4 with a 600-megapixel flow rate. HDMI 2.0 is furthermore built to accommodate ...

ANSYS, Inc., (Southpointe, Pennsylvania, USA) has unveiled the version 4.0 release of SIwave software which includes new features for signal-integrity, power-integrity and electromagnetic ...

Interconnect cables play an important role in electronics testing. As high-speed signal communications continue to advance, cabling solutions will need to keep up with high-speed, multiport testing.

Based on the Tektronix 5 Series mixed-signal oscilloscope, the B version adds an auxiliary trigger input and extends generator frequency. These upgraded capabilities enable fast, thorough checks of ...

Signal integrity is the primary measure of signal quality. Its importance increases with higher signal speed, oscilloscope bandwidth, the need to view small signals, or the need to see small changes ...

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...

The need for high-frequency semiconductor devices is surging, fueled by growing demand for advanced telecommunications, faster sensors, and increasingly autonomous vehicles. The advent of ...

RIO RANCHO, N.M.--(BUSINESS WIRE)--Alta Data Technologies (Alta) announces the release of an innovative network appliance that provides advanced ARINC-429 signal parametrics testing: eNet-A429P. The ...

Signal integrity is a critical design consideration in modern electronic systems, particularly those that depend on high-speed interconnects. As data rates climb and interconnect geometries become ...

A next-generation board-test system combines structural, parametric, high-speed interconnect, and functional testing to address the growing complexity of AI and data-centre hardware manufacturing.