A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.